Pressure‐enhanced interdiffusion in amorphous Si/Ge multilayers

Diffuse X-ray scattering of amorphous multilayers

We present a new method to measure the difuse scattering of amorphous multilayers. In contrast to conventional scans, that all take place in the plane of reflection, in this out-of-plane scattering geometry the accessible range in parallel momentum transfer Qi is not limited by the sample surface. We can therefore record data continuously from

Studies of domain dynamics in amorphous Dy/Fe multilayers

Analysis of x - ray diffraction as a probe of interdiffusion in Si / SiGe heterostructures

Analysis of x-ray diffraction as a probe of interdiffusion in Si/SiGe heterostructures D.B. Aubertine, N. Ozguven, and P.C. McIntyre Department of Materials Science and Engineering Stanford University, Stanford, CA S. Brennan Stanford Synchrotron Radiation Laboratory Stanford Linear Accelerator Center, Stanford, CA We investigate numerical simulations that utilize a non-linear interdiffusion so...

X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating

A technique for measuring interdiffusion in multilayer materials during rapid heating using X-ray reflectivity is described. In this technique the sample is bent to achieve a range of incident angles simultaneously, and the scattered intensity is recorded on a fast high-dynamic-range mixed-mode pixel array detector. Heating of the multilayer is achieved by electrical resistive heating of the si...

Two-dimensional XY -like amorphous Co68Fe24Zr8/Al70Zr30 multilayers

We present an experimental realization of a magnetic two-dimensional XY system using amorphous materials. The classification of the dimensionality is based on the critical behavior of amorphous Co68Fe24Zr8(d)/Al70O30 (20Å) multilayers, where d = 11 − 16Å. Analysis of the remanent magnetization, the magnetic isotherms, the initial susceptibility, and the magnetic correlation length shows that th...